UM

Browse/Search Results:  1-5 of 5 Help

Selected(0)Clear Items/Page:    Sort:
In situ X-ray diffraction study of the formation of TiSi 2 -C49 phase from Ti-Si multilayers on Si(100) Journal article
Materials Chemistry & Physics, 1995,Volume: 40,Issue: 2,Page: 82-86
Authors:  Sariel J.;  Chen H.;  Jongste J.F.;  Radelaar S.
Favorite |  | TC[WOS]:1 TC[Scopus]:1 | Submit date:2019/04/08
Titanium disilicide  X-ray diffraction  
In situ X-ray diffraction study of the formation of TiSi 2 -C49 phase from Ti-Si multilayers on Si(100) Journal article
Materials Chemistry & Physics, 1995,Volume: 40,Issue: 2,Page: 82-86
Authors:  Sariel J.;  Chen H.;  Jongste J.F.;  Radelaar S.
Favorite |  | TC[WOS]:1 TC[Scopus]:1 | Submit date:2019/04/08
Titanium disilicide  X-ray diffraction  
Structural properties of InN films grown on GaAs substrates: observation of the zincblende polytpe Journal article
Journal of Crystal Growth, 1993,Volume: 127,Issue: 1-4,Page: 204-208
Authors:  Strite S.;  Chandrasekhar D.;  Smith D.J.;  Sariel J.;  Chen H.;  Teraguchi N.;  Morkoc H.
Favorite |  | TC[WOS]:92 TC[Scopus]:91 | Submit date:2019/04/08
Structural properties of InN films grown on GaAs substrates: observation of the zincblende polytpe Journal article
Journal of Crystal Growth, 1993,Volume: 127,Issue: 1-4,Page: 204-208
Authors:  Strite S.;  Chandrasekhar D.;  Smith D.J.;  Sariel J.;  Chen H.;  Teraguchi N.;  Morkoc H.
Favorite |  | TC[WOS]:92 TC[Scopus]:91 | Submit date:2019/04/08
Time resolved X-ray diffraction study of the transformation kinetics of TiSi2-C49 in amorphous Si/Ti multilayers Conference paper
Materials Research Society Symposium Proceedings
Authors:  Sariel J.;  Chen Haydn;  Jongste J.F.;  Radelaar S.
Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2019/04/08