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X-ray truncation rods analysis of Cu thin films on C-plane sapphire Journal article
Materials Research Society Symposium Proceedings, 1996,Volume: 437,Page: 21-26
Authors:  Chung K.S.;  Hong Hawoong;  Aburano R.D.;  Roesler J.M.;  Chiang T.C.;  Chen Haydn
Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2019/04/08
X-ray truncation rods analysis of Cu thin films on C-plane sapphire Journal article
Materials Research Society Symposium Proceedings, 1996,Volume: 437,Page: 21-26
Authors:  Chung K.S.;  Hong Hawoong;  Aburano R.D.;  Roesler J.M.;  Chiang T.C.;  Chen Haydn
Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Physical Review B, 1995,Volume: 52,Issue: 3,Page: 1839-1847
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.;  Zschack P.;  Chen H.;  Chiang T.-C.
Favorite |  | TC[WOS]:31 TC[Scopus]:37 | Submit date:2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Physical Review B, 1995,Volume: 52,Issue: 3,Page: 1839-1847
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.;  Zschack P.;  Chen H.;  Chiang T.-C.
Favorite |  | TC[WOS]:31 TC[Scopus]:37 | Submit date:2019/04/08