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In situ X-ray diffraction study of the formation of TiSi 2 -C49 phase from Ti-Si multilayers on Si(100) Journal article
Materials Chemistry & Physics, 1995,Volume: 40,Issue: 2,Page: 82-86
Authors:  Sariel J.;  Chen H.;  Jongste J.F.;  Radelaar S.
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Titanium disilicide  X-ray diffraction  
In situ X-ray diffraction study of the formation of TiSi 2 -C49 phase from Ti-Si multilayers on Si(100) Journal article
Materials Chemistry & Physics, 1995,Volume: 40,Issue: 2,Page: 82-86
Authors:  Sariel J.;  Chen H.;  Jongste J.F.;  Radelaar S.
Favorite |  | TC[WOS]:1 TC[Scopus]:1 | Submit date:2019/04/08
Titanium disilicide  X-ray diffraction  
Time resolved X-ray diffraction study of the transformation kinetics of TiSi2-C49 in amorphous Si/Ti multilayers Conference paper
Materials Research Society Symposium Proceedings
Authors:  Sariel J.;  Chen Haydn;  Jongste J.F.;  Radelaar S.
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