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X-ray truncation rods analysis of Cu thin films on C-plane sapphire Journal article
Materials Research Society Symposium Proceedings, 1996,Volume: 437,Page: 21-26
Authors:  Chung K.S.;  Hong Hawoong;  Aburano R.D.;  Roesler J.M.;  Chiang T.C.;  Chen Haydn
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X-ray truncation rods analysis of Cu thin films on C-plane sapphire Journal article
Materials Research Society Symposium Proceedings, 1996,Volume: 437,Page: 21-26
Authors:  Chung K.S.;  Hong Hawoong;  Aburano R.D.;  Roesler J.M.;  Chiang T.C.;  Chen Haydn
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X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth Journal article
Journal of Applied Physics, 1996,Volume: 79,Issue: 9,Page: 6858-6864
Authors:  Hong H.;  Aburano R.D.;  Chung K.-S.;  Lin D.-S.;  Hirschorn E.S.;  Chiang T.-C.;  Chen H.
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X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth Journal article
Journal of Applied Physics, 1996,Volume: 79,Issue: 9,Page: 6858-6864
Authors:  Hong H.;  Aburano R.D.;  Chung K.-S.;  Lin D.-S.;  Hirschorn E.S.;  Chiang T.-C.;  Chen H.
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Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Physical Review B, 1995,Volume: 52,Issue: 3,Page: 1839-1847
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.;  Zschack P.;  Chen H.;  Chiang T.-C.
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Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Physical Review B, 1995,Volume: 52,Issue: 3,Page: 1839-1847
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.;  Zschack P.;  Chen H.;  Chiang T.-C.
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Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers Journal article
Physical Review B, 1993,Volume: 47,Issue: 11,Page: 6450-6454
Authors:  Hong H.;  Aburano R.D.;  Hirschorn E.S.;  Zschack P.;  Chen H.;  Chiang T.-C.
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Interaction of (1×2)-reconstructed Si(100) and Ag(110):Cs surfaces with C60 overlayers Journal article
Physical Review B, 1993,Volume: 47,Issue: 11,Page: 6450-6454
Authors:  Hong H.;  Aburano R.D.;  Hirschorn E.S.;  Zschack P.;  Chen H.;  Chiang T.-C.
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C 60 encapsulation of the Si(111)-(7×7) surface Journal article
Applied Physics Letters, 1992,Volume: 61,Issue: 26,Page: 3127-3129
Authors:  Hong H.;  McMahon W.E.;  Zschack P.;  Lin D.-S.;  Aburano R.D.;  Chen H.;  Chiang T.-C.
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C 60 encapsulation of the Si(111)-(7×7) surface Journal article
Applied Physics Letters, 1992,Volume: 61,Issue: 26,Page: 3127-3129
Authors:  Hong H.;  McMahon W.E.;  Zschack P.;  Lin D.-S.;  Aburano R.D.;  Chen H.;  Chiang T.-C.
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