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Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning Journal article
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2017,Volume: 13,Issue: 3,Page: 1213-1226
Authors:  Liu, Zhenbao;  Jia, Zhen;  Vong, Chi-Man;  Bu, Shuhui;  Han, Junwei;  Tang, Xiaojun
Favorite |  | TC[WOS]:51 TC[Scopus]:60 | Submit date:2018/10/30
Analog Circuits  Deep Belief Network  Deep Learning  Diagnosis  Failure  Fault  Restricted Boltzmann Machines  
A new framework for intelligent simultaneous-fault diagnosis of rotating machinery using pairwise-coupled sparse Bayesian extreme learning committee machine Journal article
PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART C-JOURNAL OF MECHANICAL ENGINEERING SCIENCE, 2017,Volume: 231,Issue: 6,Page: 1146-1161
Authors:  Wong, Pak Kin;  Zhong, Jian-Hua;  Yang, Zhi-Xin;  Vong, Chi Man
Favorite |  | TC[WOS]:7 TC[Scopus]:7 | Submit date:2018/10/30
Rotating Machinery  Simultaneous-fault Diagnosis  Pairwise-coupled Sparse Bayesian Extreme Learning Machine  Probabilistic Committee Machine