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Quantization of excitons in CuCl epitaxial thin films: Behavior between a two-dimensional quantum well and the bulk Journal article
Physical Review B, 1995,Volume: 52,Issue: 4,Page: 2640-2648
Authors:  Tang Z.K.;  Yanase A.;  Segawa Y.;  Matsuura N.;  Cho K.
Favorite |  | TC[WOS]:22 TC[Scopus]:22 | Submit date:2019/04/08
X-ray thermal-diffuse-scattering study of soft modes in paraelectric BaTiO3 Journal article
Physical Review B, 1995,Volume: 51,Issue: 10,Page: 6696-6699
Authors:  Takesue N.;  Maglione M.;  Chen H.
Favorite |  | TC[WOS]:15 TC[Scopus]:14 | Submit date:2019/04/08
X-ray thermal-diffuse-scattering study of soft modes in paraelectric BaTiO3 Journal article
Physical Review B, 1995,Volume: 51,Issue: 10,Page: 6696-6699
Authors:  Takesue N.;  Maglione M.;  Chen H.
Favorite |  | TC[WOS]:15 TC[Scopus]:14 | Submit date:2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Physical Review B, 1995,Volume: 52,Issue: 3,Page: 1839-1847
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.;  Zschack P.;  Chen H.;  Chiang T.-C.
Favorite |  | TC[WOS]:32 TC[Scopus]:37 | Submit date:2019/04/08
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction Journal article
Physical Review B, 1995,Volume: 52,Issue: 3,Page: 1839-1847
Authors:  Aburano R.D.;  Hong H.;  Roesler J.M.;  Chung K.;  Lin D.-S.;  Zschack P.;  Chen H.;  Chiang T.-C.
Favorite |  | TC[WOS]:32 TC[Scopus]:37 | Submit date:2019/04/08