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Effect of loading duration on uncertainty in creep analysis of clay Journal article
INTERNATIONAL JOURNAL FOR NUMERICAL AND ANALYTICAL METHODS IN GEOMECHANICS, 2018,Volume: 42,Issue: 11,Page: 1235-1254
Authors:  Tan, Fang;  Zhou, Wan-Huan;  Yuen, Ka-Veng
Favorite |  | TC[WOS]:15 TC[Scopus]:16 | Submit date：2018/10/30
Bayesian probabilistic method  creep analysis  loading duration  model updating  uncertainty  
Model updating and uncertainty analysis for creep behavior of soft soil Journal article
COMPUTERS AND GEOTECHNICS, 2018,Volume: 100,Page: 135-143
Authors:  Zhou, Wan-Huan;  Tan, Fang;  Yuen, Ka-Veng
Favorite |  | TC[WOS]:24 TC[Scopus]:28 | Submit date：2018/10/30
Bayesian model class selection  Creep  Elastic viscoplastic models  TMCMC method  Uncertainty evaluation  
Large-strain elastic viscoplastic consolidation analysis of very soft clay layers with vertical drains under preloading Journal article
Canadian Geotechnical Journal, 2014,Volume: 51,Issue: 2,Page: 144-157
Authors:  Hu Y.-Y.;  Zhou W.-H.;  Cai Y.-Q.
Favorite |  | TC[WOS]:24 TC[Scopus]:33 | Submit date：2018/12/21
Consolidation  Elastic Viscoplastic Model  Large Strain  Soft Clay  Vertical Drain  
Development and Active Disturbance Rejection Control of a Compliant Micro-/Nanopositioning Piezostage with Dual Mode Journal article
IEEE Transactions on Industrial Electronics, 2014,Volume: 61,Issue: 3,Page: 1475
Authors:  Tang H.;  Li Y.
Favorite |  | TC[WOS]:103 TC[Scopus]:117 | Submit date：2018/10/30
Active disturbance rejection control  atomic force microscope (AFM)  lever displacement amplifiers (LDAs)  micro-/nanopositioning system  plant uncertainties  
FBG-based creep analysis of GFRP materials embedded in concrete Journal article
Mathematical Problems in Engineering, 2013,Volume: 2013
Authors:  Li G.-W.;  Hong C.-Y.;  Dai J.;  Yu L.;  Zhou W.-H.
Favorite |  | TC[WOS]:8 TC[Scopus]:12 | Submit date：2018/12/21
Design, analysis, and test of a novel 2-DOF nanopositioning system driven by dual mode Journal article
IEEE Transactions on Robotics, 2013,Volume: 29,Issue: 3,Page: 650
Authors:  Tang H.;  Li Y.
Favorite |  | TC[WOS]:81 TC[Scopus]:101 | Submit date：2018/10/30
Active disturbance rejection controller (ADRC)  atomic force microscope (AFM)  dual mode  nanopositioning system  plant uncertainties