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A 0.04% BER Strong PUF with Cell-Bias-Based CRPs Filtering and Background Offset Calibration Journal article
IEEE Transactions on Circuits and Systems I: Regular Papers, 2020,Volume: 67,Issue: 11,Page: 3853-3865
Authors:  Liu,Jiahao;  Zhu,Yan;  Chan,Chi Hang;  Martins,Rui Paulo
Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2021/03/04
authentication  hardware security  Internet of Things  low power  machine learning attacks  Physical unclonable function (PUF)  
Experimental characterization of an embossed capacitive micromachined ultrasonic transducer cell Journal article
Micromachines, 2020,Volume: 11,Issue: 2,Page: 1-15
Authors:  Yu,Yuanyu;  Wang,Jiujiang;  Liu,Xin;  Pun,Sio Hang;  Zhang,Shuang;  Cheng,Ching Hsiang;  Lei,Kin Fong;  Vai,Mang I.;  Mak,Peng Un
Favorite |  | TC[WOS]:2 TC[Scopus]:1 | Submit date:2021/03/11
Capacitive micromachined ultrasonic transducer (CMUT)  Collapse mode  Embossed CMUT  Output pressure  
High-Performance AlGaN/GaN/Si Power MOSHEMTs With ZrO2 Gate Dielectric Journal article
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018,Volume: 65,Issue: 12,Page: 5337-5342
Authors:  Jiang, Huaxing;  Liu, Chao;  Ng, Kar Wei;  Tang, Chak Wah;  Lau, Kei May
Favorite |  | TC[WOS]:9 TC[Scopus]:10 | Submit date:2019/01/17
III-nitride  gate dielectric  leakage  metal-oxide-semiconductor high electron mobility transistors (MOSHEMTs)  power  ZrO2  
High-Performance AlGaN/GaN/Si Power MOSHEMTs With ZrO 2 Gate Dielectric Journal article
IEEE Transactions on Electron Devices, 2018,Volume: 65,Issue: 12,Page: 5337-5342
Authors:  Jiang H.;  Liu C.;  Ng K.W.;  Tang C.W.;  Lau K.M.
Favorite |  | TC[WOS]:9 TC[Scopus]:10 | Submit date:2019/04/08
gate dielectric  III-nitride  leakage  metal-oxide-semiconductor high electron mobility transistors (MOSHEMTs)  power  ZrO 2  
Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning Journal article
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2017,Volume: 13,Issue: 3,Page: 1213-1226
Authors:  Liu, Zhenbao;  Jia, Zhen;  Vong, Chi-Man;  Bu, Shuhui;  Han, Junwei;  Tang, Xiaojun
Favorite |  | TC[WOS]:51 TC[Scopus]:59 | Submit date:2018/10/30
Analog Circuits  Deep Belief Network  Deep Learning  Diagnosis  Failure  Fault  Restricted Boltzmann Machines  
Power system voltage collapse alarm system using fuzzy logic Journal article
Dianwang Jishu/Power System Technology, 2012,Volume: 36,Issue: 9,Page: 133-139
Authors:  Zhang X.;  Wong C.;  Wong M.;  Dai N.
Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2019/03/04
Alarm system  Fuzzy logic  Load dynamics  Voltage collapse  Voltage stability index  
Power system voltage collapse alarm system using fuzzy logic Journal article
Dianwang Jishu/Power System Technology, 2012,Volume: 36,Issue: 9,Page: 133-139
Authors:  Zhang,Xi;  Wong,Chikong;  Wong,Manchung;  Dai,Ningyi
Favorite |  | TC[WOS]:0 TC[Scopus]:1 | Submit date:2021/03/09
Alarm system  Fuzzy logic  Load dynamics  Voltage collapse  Voltage stability index  
Comparison of voltage stability indexes considering dynamic load Conference paper
2011 IEEE Electrical Power and Energy Conference, Winnipeg, MB, Canada, 3-5 Oct. 2011
Authors:  Zhang Xi;  Wong Chi Kong
Favorite |  | TC[WOS]:0 TC[Scopus]:3 | Submit date:2019/03/21
Transmission Limit  Voltage Collapse  Voltage Stability Index  Dynamic Load  
Criteria of dynamic voltage stability based on wavelet transform Journal article
Dianli Xitong Zidonghua/Automation of Electric Power Systems, 2008,Volume: 32,Issue: 5,Page: 24-28
Authors:  Wong C.K.;  Lu C.;  Li L.;  Han Y.
Favorite |  | TC[WOS]:0 TC[Scopus]:0 | Submit date:2019/03/04
Phasor measurement unit (PMU)  Transmission limitation  Voltage stability  Wavelet transform