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Structural and dielectric properties of Ba0.85Sr 0.15(Zr0.18Ti0.85)O3 thin films grown by a sol-gel process Conference paper
Ceramics International
Authors:  Zhai J.;  Yao X.;  Chen H.
Favorite |  | TC[WOS]:26 TC[Scopus]:27 | Submit date:2019/04/08
B. Microstructure  BSZT thin film  C. Dielectric properties  Phase transition