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A 0.083-mm225.2-to-29.5 GHz multi-LC-Tank class-F234VCO with a 189.6-dBc/Hz FOM
Guo,Hao1; Chen,Yong1; Mak,Pui In1,2; Martins,Rui P.1,2,3
2018-04-01
Source PublicationIEEE Solid-State Circuits Letters
Volume1Issue:4Pages:86-89
AbstractA compact multi-LC-tank Class-F234 voltage-controlled oscillator (VCO) for mm-wave applications is reported. It features an inductive multiplier inside the positive feedback loop to suppress the effective noise factor of the MOS devices. Also, by pseudo-squaring the drain-voltage waveform of the MOS devices via 2nd, 3rd, and 4th harmonic peaking, we obtain a lower impulse-sensitivity-function rms value. Prototyped in 65-nm CMOS, the VCO at 28 GHz shows a phase noise of -114.72-dBc/Hz at 1-MHz offset, while consuming 6.6 mW at 0.55 V. The tuning range is 15.7% (25.2-29.5 GHz) and the chip area is 0.083 mm2.
KeywordClass-F234voltage-controlled oscillator (VCO) Figureof- merit (FOM) Flicker noise Impulse sensitivity function (ISF) Multi- LC-tank Thermal noise
DOI10.1109/LSSC.2018.2851499
URLView the original
Language英语
Scopus ID2-s2.0-85062460676
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Document TypeJournal article
CollectionUniversity of Macau
Corresponding AuthorChen,Yong
Affiliation1.State-Key Laboratory of Analog and Mixed-Signal VLSI,University of Macau,Macau,999078,Macao
2.Faculty of Science and Technology,Department of ECE,University of Macau,Macau,999078,Macao
3.Instituto Superior Técnico,Universidade de Lisboa,Lisbon,1049-001,Portugal
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Guo,Hao,Chen,Yong,Mak,Pui In,et al. A 0.083-mm225.2-to-29.5 GHz multi-LC-Tank class-F234VCO with a 189.6-dBc/Hz FOM[J]. IEEE Solid-State Circuits Letters,2018,1(4):86-89.
APA Guo,Hao,Chen,Yong,Mak,Pui In,&Martins,Rui P..(2018).A 0.083-mm225.2-to-29.5 GHz multi-LC-Tank class-F234VCO with a 189.6-dBc/Hz FOM.IEEE Solid-State Circuits Letters,1(4),86-89.
MLA Guo,Hao,et al."A 0.083-mm225.2-to-29.5 GHz multi-LC-Tank class-F234VCO with a 189.6-dBc/Hz FOM".IEEE Solid-State Circuits Letters 1.4(2018):86-89.
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