UM
Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction
Aburano R.D.1; Hong H.1; Roesler J.M.1; Chung K.1; Lin D.-S.2; Zschack P.3; Chen H.1; Chiang T.-C.1
1995
Source PublicationPhysical Review B
ISSN01631829
Volume52Issue:3Pages:1839-1847
AbstractDifferent Ag/Si(111) systems have been examined using synchrotron x-ray diffraction. Multi-atomic-layer deposition of Ag onto a Si(111)-(7×7) surface maintained at room temperature results in an unstrained, (111)-oriented film. The interface shows a Ag-modified (7×7) structure which when annealed above 200-250°C transforms to a (1×1) structure. Although this is near the characteristic temperature for formation of the (3 × 3) R30° surface reconstruction commonly observed for a monolayer of Ag adsorbed on Si(111), no evidence of this (3 × 3) R30° reconstruction was found at the interface. A Ag monolayer (3 × 3) R30° surface, further covered by multilayer Ag deposition at room temperature, also shows no indication of the (3 × 3) R30° reconstruction at the interface. This indicates that the actual interface structure may or may not be related to the clean or adsorbed layer structures. The structure of the Ag-Si interface was further characterized by scans of the crystal truncation rods. Both the (7×7) interface prepared by room-temperature deposition and the annealed (1×1) interface show fairly sharp boundaries. The results suggest some intermixing occurs at the monolayer level for the annealed interface. The structure of the Ag film was also investigated. © 1995 The American Physical Society.
DOI10.1103/PhysRevB.52.1839
URLView the original
Language英語
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Cited Times [WOS]:32   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionUniversity of Macau
Affiliation1.University of Illinois at Urbana-Champaign
2.National Chiao Tung University Taiwan
3.Oak Ridge Inst. for Sci./Education
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GB/T 7714
Aburano R.D.,Hong H.,Roesler J.M.,et al. Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction[J]. Physical Review B,1995,52(3):1839-1847.
APA Aburano R.D.,Hong H.,Roesler J.M.,Chung K.,Lin D.-S.,Zschack P.,Chen H.,&Chiang T.-C..(1995).Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction.Physical Review B,52(3),1839-1847.
MLA Aburano R.D.,et al."Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction".Physical Review B 52.3(1995):1839-1847.
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