UM
Synthesis and structural characterization of rutile SnO2 nanocrystals
Chen Z.2; Lai J.K.L.2; Shek C.H.2; Chen H.2
2003
Source PublicationJournal of Materials Research
ISSN08842914
Volume18Issue:6Pages:1289-1292
AbstractNanocrystalline tin dioxide (SnO) thin films were prepared on glass substrate by pulse laser deposition for the first time. The thin films were characterized for their composition, morphology, and crystalline structure by x-ray diffraction, transmission electron microscopy, and high-resolution transmission electron microscopy. It was found that the thin films consisted only of the tetragonal phase SnO with no structural change, and they were well crystallized during deposition. In most cases, SnO particles were overlapped, predominantly grown on preferred (101) plane, and connected with two or three neighbors through necks. The average grain size of the as-prepared thin films was about 12 nm. These facts are of great importance for sensor characteristics, since smaller grains and preferred orientation properties provide higher gas sensitivity to the whole thin films. Our findings indicate that the n-type wide-band-gas semiconductor nanocrystalline thin films can be manipulated by using pulse laser deposition techniques, offering new opportunities to control material fabrication.
DOI10.1557/JMR.2003.0176
URLView the original
Language英語English
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Cited Times [WOS]:67   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionUniversity of Macau
Affiliation1.University of Science and Technology of China
2.City University of Hong Kong
Recommended Citation
GB/T 7714
Chen Z.,Lai J.K.L.,Shek C.H.,et al. Synthesis and structural characterization of rutile SnO2 nanocrystals[J]. Journal of Materials Research,2003,18(6):1289-1292.
APA Chen Z.,Lai J.K.L.,Shek C.H.,&Chen H..(2003).Synthesis and structural characterization of rutile SnO2 nanocrystals.Journal of Materials Research,18(6),1289-1292.
MLA Chen Z.,et al."Synthesis and structural characterization of rutile SnO2 nanocrystals".Journal of Materials Research 18.6(2003):1289-1292.
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