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Design and analysis of a direct-drive wind power generator with ultra-high torque density Journal article
Journal of Applied Physics, 2015,Volume: 117,Issue: 17
Authors:  Linni Jian;  Yujun Shi;  Jin Wei;  Yanchong Zheng
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Gauging film thickness: A comparison of an x-ray diffraction technique with Rutherford backscattering spectrometry Journal article
Journal of Applied Physics, 1985,Volume: 57,Issue: 2,Page: 643-645
Authors:  Coulman B.;  Chen H.;  Rehn L.E.
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Gauging film thickness: A comparison of an x-ray diffraction technique with Rutherford backscattering spectrometry Journal article
Journal of Applied Physics, 1985,Volume: 57,Issue: 2,Page: 643-645
Authors:  Coulman B.;  Chen H.;  Rehn L.E.
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Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique Journal article
Journal of Applied Physics, 1986,Volume: 59,Issue: 10,Page: 3467-3474
Authors:  Coulman B.;  Chen H.
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Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique Journal article
Journal of Applied Physics, 1986,Volume: 59,Issue: 10,Page: 3467-3474
Authors:  Coulman B.;  Chen H.
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In situ x-ray diffraction measurement of Pd 2 Si transformation kinetics using a linear position-sensitive detector Journal article
Journal of Applied Physics, 1988,Volume: 63,Issue: 4,Page: 1182-1190
Authors:  Little T.W.;  Chen H.
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In situ x-ray diffraction measurement of Pd 2 Si transformation kinetics using a linear position-sensitive detector Journal article
Journal of Applied Physics, 1988,Volume: 63,Issue: 4,Page: 1182-1190
Authors:  Little T.W.;  Chen H.
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Phase formation and identification of an epitaxial Fe-Ni alloy silicide Journal article
Journal of Applied Physics, 1989,Volume: 65,Issue: 1,Page: 154-157
Authors:  Chang Y.S.;  Hsieh I.J.;  Chen H.
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Phase formation and identification of an epitaxial Fe-Ni alloy silicide Journal article
Journal of Applied Physics, 1989,Volume: 65,Issue: 1,Page: 154-157
Authors:  Chang Y.S.;  Hsieh I.J.;  Chen H.
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An in situ observation of the growth kinetics and stress relaxation Pd 2Si thin films on Si(111) Journal article
Journal of Applied Physics, 1990,Volume: 67,Issue: 8,Page: 3689-3692
Authors:  White G.E.;  Chen H.
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An in situ observation of the growth kinetics and stress relaxation Pd 2Si thin films on Si(111) Journal article
Journal of Applied Physics, 1990,Volume: 67,Issue: 8,Page: 3689-3692
Authors:  White G.E.;  Chen H.
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In situ study of film stresses in metal silicides using absorption-edge-contour mapping Journal article
Journal of Applied Physics, 1990,Volume: 68,Issue: 7,Page: 3317-3321
Authors:  White G.E.;  Chen H.
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Microstructural changes in confined submicrometer aluminum films Journal article
Journal of Applied Physics, 1993,Volume: 73,Issue: 5,Page: 2575-2577
Authors:  Chou M.L.;  Rishton S.A.;  Tu K.N.;  Chen H.
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Microstructural changes in confined submicrometer aluminum films Journal article
Journal of Applied Physics, 1993,Volume: 73,Issue: 5,Page: 2575-2577
Authors:  Chou M.L.;  Rishton S.A.;  Tu K.N.;  Chen H.
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Characterization of texture and microstructure of oriented PbTiO 3 thin films grown by metalorganic chemical vapor deposition on Si(100) Journal article
Journal of Applied Physics, 1994,Volume: 76,Issue: 8,Page: 4805-4810
Authors:  Yen B.M.;  Liu D.;  Bai G.R.;  Chen H.
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Characterization of texture and microstructure of oriented PbTiO 3 thin films grown by metalorganic chemical vapor deposition on Si(100) Journal article
Journal of Applied Physics, 1994,Volume: 76,Issue: 8,Page: 4805-4810
Authors:  Yen B.M.;  Liu D.;  Bai G.R.;  Chen H.
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Electronic structure of barium titanate studies by the extended Hückel tight-binding method Journal article
Journal of Applied Physics, 1994,Volume: 76,Issue: 1,Page: 451-454
Authors:  Holma M.;  Kitamura M.;  Chen H.
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Electronic structure of barium titanate studies by the extended Hückel tight-binding method Journal article
Journal of Applied Physics, 1994,Volume: 76,Issue: 1,Page: 451-454
Authors:  Holma M.;  Kitamura M.;  Chen H.
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In-situ x-ray diffraction study of the impurity effects on the cubic-to-tetragonal phase transformation in PbTiO3 Journal article
Journal of Applied Physics, 1994,Volume: 76,Issue: 10,Page: 5856-5863
Authors:  Takesue N.;  Chen H.
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In-situ x-ray diffraction study of the impurity effects on the cubic-to-tetragonal phase transformation in PbTiO3 Journal article
Journal of Applied Physics, 1994,Volume: 76,Issue: 10,Page: 5856-5863
Authors:  Takesue N.;  Chen H.
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