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Analysis of Reference Error in High-Speed SAR ADCs With Capacitive DAC Journal article
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019,Volume: 66,Issue: 1,Page: 82-93
Authors:  Li, Cheng;  Chan, Chi-Hang;  Zhu, Yan;  Martins, Rui P.
Favorite  |  View/Download:2/0  |  Submit date:2019/01/17
Reference error  reference buffer  successive-approximation-register (SAR)  analog-to-digital converter (ADC)  reference ripple  
Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC Conference paper
Authors:  Wang, Guancheng;  Li, Cheng;  Zhu, Yan;  Zhong, Jianyu;  Lu, Yan;  Chan, Chi-Hang;  Martins, Rui P.
Favorite  |  View/Download:16/0  |  Submit date:2018/10/30
Gain error calibration  testing signal generation  SAR ADC  bridge DAC  low-dropout (LDO) regulator  
A 0.19 mm(2) 10 b 2.3 GS/s 12-Way Time-Interleaved Pipelined-SAR ADC in 65-nm CMOS Conference paper
Authors:  Zhu, Yan;  Chan, Chi-Hang;  Zheng, Zi-Hao;  Li, Cheng;  Zhong, Jian-Yu;  Martins, Rui P.
Favorite  |  View/Download:13/0  |  Submit date:2018/10/30
Time-interleaved ADC  sampling front-end design  passive sharing  pipelined-SAR ADC  switch bootstrap technique  
Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 11,Page: 2279-2289
Authors:  Wang, Guan Cheng;  Zhu, Yan;  Chan, Chi-Hang;  Seng-Pan, U.;  Martins, Rui P.
Favorite  |  View/Download:2/0  |  Submit date:2019/01/17
Bridge digital-to-analog converter (DAC)  gain error calibration  successive approximation register (SAR)  analog-to-digital converters (ADCs)  testing signal generation (TSG)  
A 5.35-mW 10-MHz Single-Opamp Third-Order CT Delta Sigma Modulator With CTC Amplifier and Adaptive Latch DAC Driver in 65-nm CMOS Conference paper
Authors:  Wang, Wei;  Zhu, Yan;  Chan, Chi-Hang;  Martins, Rui Paulo
Favorite  |  View/Download:14/0  |  Submit date:2018/10/30
Terms-Analog-to-digital conversion (ADC)  continuous-time (CT) delta-sigma modulator  DAC driver  passive integrator  single amplifier biquad (SAB)  
A 5.35-mW 10-MHz Single-Opamp Third-Order CT Δ\Σ Modulator with CTC Amplifier and Adaptive Latch DAC Driver in 65-nm CMOS Journal article
IEEE Journal of Solid-State Circuits, 2018,Volume: 53,Issue: 10,Page: 2783-2794
Authors:  Wang,Wei;  Zhu,Yan;  Chan,Chi Hang;  Martins,Rui Paulo
Favorite  |  View/Download:2/0  |  Submit date:2019/08/22
Analog-to-digital conversion (ADC)  continuous-time (CT) delta-sigma modulator  DAC driver  passive integrator  single amplifier biquad (SAB)  
A 16-mW 1-GS/s With 49.6-dB SNDR TI-SAR ADC for Software-Defined Radio in 65-nm CMOS Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 3,Page: 572-583
Authors:  Qiu, Lei;  Tang, Kai;  Zheng, Yuanjin;  Siek, Liter;  Zhu, Yan;  U, Seng-Pan
Favorite  |  View/Download:11/0  |  Submit date:2018/10/30
Digital Background Calibration  Subradix-2  Successive Pproximation Register (Sar) Analog-to-digital Converters (Adcs)  Time Interleaved (Ti)  Time Skew  
A Two-Way Interleaved 7-b 2.4-GS/s 1-Then-2 b/Cycle SAR ADC With Background Offset Calibration Journal article
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2018,Volume: 53,Issue: 3,Page: 850-860
Authors:  Chan, Chi-Hang;  Zhu, Yan;  Zhang, Wai-Hong;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite  |  View/Download:16/0  |  Submit date:2018/10/30
1-then-2 B/cycle Sar Adc  Analog-to-digital Conversion  Background Offset Calibration  Multi-bit/cycle Sar Adc  Time Interleaving  
Passive Noise Shaping in SAR ADC With Improved Efficiency Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 2,Page: 416-420
Authors:  Song, Yan;  Chan, Chi-Hang;  Zhu, Yan;  Geng, Li;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite  |  View/Download:17/0  |  Submit date:2018/10/30
Analog-to-digital Converter (Adc)  Delta Sampling  Oversampling  Passive Noise Shaping (Pns)  Successive Approximation Register (Sar)  
60-dB SNDR 100-MS/s SAR ADCs With Threshold Reconfigurable Reference Error Calibration Journal article
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2017,Volume: 52,Issue: 10,Page: 2576-2588
Authors:  Chan, Chi-Hang;  Zhu, Yan;  Li, Cheng;  Zhang, Wai-Hong;  Ho, Iok-Meng;  Wei, Lai;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite  |  View/Download:14/0  |  Submit date:2018/10/30
Reference Buffer  Reference Error Calibration  Successive Approximation Register (Sar) Analog-to-digital Converter (Adc)  Threshold Reconfigurable Comparator