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Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC Conference paper
Authors:  Wang, Guancheng;  Li, Cheng;  Zhu, Yan;  Zhong, Jianyu;  Lu, Yan;  Chan, Chi-Hang;  Martins, Rui P.
Favorite  |  View/Download:24/0  |  Submit date:2018/10/30
Gain error calibration  testing signal generation  SAR ADC  bridge DAC  low-dropout (LDO) regulator  
A 12b 180MS/s 0.068mm(2) With Full-Calibration-Integrated Pipelined-SAR ADC Journal article
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2017,Volume: 64,Issue: 7,Page: 1684-1695
Authors:  Zhong, Jianyu;  Zhu, Yan;  Chan, Chi-Hang;  Sin, Sai-Weng;  U, Seng-Pan;  Martins, Rui Paulo
Favorite  |  View/Download:10/0  |  Submit date:2018/10/30
Analog-to-digital converter (ADC)  successive approximation architecture  low power  switched-capacitor circuits  
A 12b 180MS/s 0.068mm2 with Full-Calibration-Integrated Pipelined-SAR ADC Journal article
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017,Volume: 64,Issue: 7,Page: 1684-1695
Authors:  Jianyu Zhong;  Yan Zhu;  Chi-Hang Chan;  Sai-Weng Sin;  Seng-Pan U;  Rui Paulo Martins
Favorite  |  View/Download:10/0  |  Submit date:2019/02/11
Analog-to-digital Converter (Adc)  Low Power  Successive Approximation Architecture  Switched-capacitor Circuits  
A 12b 180MS/s 0.068mm2 pipelined-SAR ADC with merged-residue DAC for noise reduction Conference paper
ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference, Lausanne, Switzerland, 12-15 Sept. 2016
Authors:  Jianyu Zhong;  Yan Zhu;  Chi-Hang Chan;  Sai-Weng Sin;  Seng-Pan U;  R. P. Martins
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Thermal and Reference Noise Analysis of Time-Interleaving SAR and Partial-Interleaving Pipelined-SAR ADCs Journal article
IEEE Transactions on Circuits and Systems I: Regular Papers, 2015,Volume: 62,Issue: 9,Page: 2196-2206
Authors:  Jianyu Zhong;  Yan Zhu;  Sai-Weng Sin;  Seng-Pan U;  Rui Paulo Martins
Favorite  |  View/Download:7/0  |  Submit date:2019/02/11
Analog-to-digital Converter (Adc)  Reference Noise  Successive-approximation-register (Sar) Adc  Thermal Noise  
Inter-Stage Gain Error self-calibration of a 31.5fJ 10b 470MS/S pipelined-SAR ADC Conference paper
2012 IEEE Asian Solid State Circuits Conference (A-SSCC), Kobe, JAPAN, NOV 12-14, 2012
Authors:  Jianyu Zhong;  Yan Zhu;  Sai-Weng Sin;  Seng-Pan U;  Rui P. Martins
Favorite  |  View/Download:8/0  |  Submit date:2019/02/11