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An in situ observation of the growth kinetics and stress relaxation Pd 2Si thin films on Si(111) Journal article
Journal of Applied Physics, 1990,Volume: 67,Issue: 8,Page: 3689-3692
Authors:  White G.E.;  Chen H.
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An in situ observation of the growth kinetics and stress relaxation Pd 2Si thin films on Si(111) Journal article
Journal of Applied Physics, 1990,Volume: 67,Issue: 8,Page: 3689-3692
Authors:  White G.E.;  Chen H.
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In situ study of film stresses in metal silicides using absorption-edge-contour mapping Journal article
Journal of Applied Physics, 1990,Volume: 68,Issue: 7,Page: 3317-3321
Authors:  White G.E.;  Chen H.
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Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
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Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
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Variation of Pendellösung fringes in elastically deformed silicon single crystals Journal article
Materials Letters, 1984,Volume: 2,Issue: 4 PART B,Page: 347-350
Authors:  White G.E.;  Chen H.
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Variation of Pendellösung fringes in elastically deformed silicon single crystals Journal article
Materials Letters, 1984,Volume: 2,Issue: 4 PART B,Page: 347-350
Authors:  White G.E.;  Chen H.
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An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces Journal article
Thin Solid Films, 1982,Volume: 93,Issue: 1-2,Page: 161-169
Authors:  Chen H.;  White G.E.;  Stock S.R.;  Ho P.S.
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An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces Journal article
Thin Solid Films, 1982,Volume: 93,Issue: 1-2,Page: 161-169
Authors:  Chen H.;  White G.E.;  Stock S.R.;  Ho P.S.
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