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Analysis of Indium Tin Oxide Film Using Argon Fluroide (ArF) Laser-Excited Atomic Fluorescence of Ablated Plumes Journal article
APPLIED SPECTROSCOPY, 2017,Volume: 71,Issue: 4,Page: 735-743
Authors:  Ho, Sut Kam;  Garcia, Dario Machado
Favorite | View/Download：17/0 | TC[WOS]:1 TC[Scopus]:1 | Submit date：2018/10/30
Indium tin oxide  ITO  ITO film  laser-excited atomic fluorescence  LEAF  destructiveness  thin-film analysis  
Modulating Cationic Ratios for High-Performance Transparent Solution-Processed Electronics Journal article
ACS Applied Materials and Interfaces, 2016,Volume: 8,Issue: 2,Page: 1139-1146
Authors:  John R.A.;  Nguyen A.C.;  Chen Y.;  Shukla S.;  Chen S.;  Mathews N.
Favorite | View/Download：8/0 | TC[WOS]:18 TC[Scopus]:19 | Submit date：2019/04/08
activation energy  indium zinc tin oxide  mobility  on-off ratio  printed electronics  thin film transistors  
Residual stress measurement on TiN thin films by combing nanoindentation and average X-ray strain (AXS) method Journal article
Surface and Coatings Technology, 2015,Volume: 280,Page: 43-49
Authors:  Wang A.-N.;  Huang J.-H.;  Hsiao H.-W.;  Yu G.-P.;  Chen H.
Favorite | View/Download：6/0 | TC[WOS]:11 TC[Scopus]:13 | Submit date：2019/04/08
Average X-ray strain (AXS)  Cos2αsin2ψ method  Nanoindentation  Residual stress  TiN thin film  
Synthesis and thermal stability of nanocomposite nc-TiN/a-TiB2 thin films Journal article
Acta Metallurgica Sinica (English Letters), 2005,Volume: 18,Issue: 3,Page: 307-312
Authors:  Lu Y.H.;  Zhou Z.F.;  Sit P.;  Shen Y.G.;  Li K.Y.;  Chen H.
Favorite | View/Download：6/0 | TC[WOS]:0 TC[Scopus]:0 | Submit date：2019/04/08
Annealing  Boron  Nc-TiN/a-TiB2 thin film  Reactive unbalanced dc magnetron sputtering  Thermal stability