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Growth of thin niobium crystals by the strain-anneal method Journal article
Journal of Crystal Growth, 1987,Volume: 84,Issue: 3,Page: 419-424
Authors:  Stock S.R.;  Chen H.;  Birnbaum H.K.
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Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
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Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
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The measurement of strain fields by X-ray topographic contour mapping Journal article
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, 1986,Volume: 53,Issue: 1,Page: 73-86
Authors:  Stock S.R.;  Chen H.;  Birnbaum H.K.;  Stock S.R.
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The measurement of strain fields by X-ray topographic contour mapping Journal article
Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties, 1986,Volume: 53,Issue: 1,Page: 73-86
Authors:  Stock S.R.;  Chen H.;  Birnbaum H.K.;  Stock S.R.
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Topographic EXAFS Journal article
Nature, 1984,Volume: 309,Issue: 5966,Page: 336-338
Authors:  Bowen D.K.;  Stock S.R.;  Davies S.T.;  Pantos E.;  Birnbaum H.K.;  Chen H.
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Topographic EXAFS Journal article
Nature, 1984,Volume: 309,Issue: 5966,Page: 336-338
Authors:  Bowen D.K.;  Stock S.R.;  Davies S.T.;  Pantos E.;  Birnbaum H.K.;  Chen H.
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X-ray topography of hydride domains Journal article
Materials Letters, 1983,Volume: 2,Issue: 2,Page: 173-175
Authors:  Stock S.R.;  Chasnov R.;  Chen Haydn.;  Birnbaum H.K.
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X-ray topography of hydride domains Journal article
Materials Letters, 1983,Volume: 2,Issue: 2,Page: 173-175
Authors:  Stock S.R.;  Chasnov R.;  Chen Haydn.;  Birnbaum H.K.
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An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces Journal article
Thin Solid Films, 1982,Volume: 93,Issue: 1-2,Page: 161-169
Authors:  Chen H.;  White G.E.;  Stock S.R.;  Ho P.S.
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