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A Patent Analysis of Prognostics and Health Management (PHM) Innovations for Electrical Systems Journal article
IEEE ACCESS, 2018,Volume: 6,Page: 18088-18107
Authors:  Liu, Zhenbao;  Jia, Zhen;  Vong, Chi-Man;  Han, Junwei;  Yan, Chenggang;  Pecht, Michael
Favorite | View/Download:25/0 | TC[WOS]:13 TC[Scopus]:18 | Submit date:2018/10/30
Reliability Assessment And Prediction  Prognostics And Health Management (Phm)  Application  Patents  Electrical Systems  
BoSCC: Bag of Spatial Context Correlations for Spatially Enhanced 3D Shape Representation Journal article
IEEE TRANSACTIONS ON IMAGE PROCESSING, 2017,Volume: 26,Issue: 8,Page: 3707-3720
Authors:  Han, Zhizhong;  Liu, Zhenbao;  Vong, Chi-Man;  Liu, Yu-Shen;  Bu, Shuhui;  Han, Junwei;  Chen, C. L. Philip
Favorite | View/Download:23/0 | TC[WOS]:10 TC[Scopus]:18 | Submit date:2018/10/30
Bag Of Spatial Context Correlations  Spatial Context Correlation  Spatial Context  3d Shape Representations  
Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning Journal article
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2017,Volume: 13,Issue: 3,Page: 1213-1226
Authors:  Liu, Zhenbao;  Jia, Zhen;  Vong, Chi-Man;  Bu, Shuhui;  Han, Junwei;  Tang, Xiaojun
Favorite | View/Download:28/0 | TC[WOS]:28 TC[Scopus]:42 | Submit date:2018/10/30
Analog Circuits  Deep Belief Network  Deep Learning  Diagnosis  Failure  Fault  Restricted Boltzmann Machines