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Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 11,Page: 2279-2289
Authors:  Wang, Guan Cheng;  Zhu, Yan;  Chan, Chi-Hang;  Seng-Pan, U.;  Martins, Rui P.
Favorite | View/Download:19/0 | TC[WOS]:0 TC[Scopus]:1 | Submit date:2019/01/17
Bridge digital-to-analog converter (DAC)  gain error calibration  successive approximation register (SAR)  analog-to-digital converters (ADCs)  testing signal generation (TSG)