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60-dB SNDR 100-MS/s SAR ADCs With Threshold Reconfigurable Reference Error Calibration Journal article
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2017,Volume: 52,Issue: 10,Page: 2576-2588
Authors:  Chan, Chi-Hang;  Zhu, Yan;  Li, Cheng;  Zhang, Wai-Hong;  Ho, Iok-Meng;  Wei, Lai;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite  |  View/Download:15/0  |  Submit date:2018/10/30
Reference Buffer  Reference Error Calibration  Successive Approximation Register (Sar) Analog-to-digital Converter (Adc)  Threshold Reconfigurable Comparator  
Drug screening of cancer cell lines and human primary tumors using droplet microfluidics Journal article
SCIENTIFIC REPORTS, 2017,Volume: 7,Page: 9109
Authors:  Wong, Ada Hang-Heng;  Li, Haoran;  Jia, Yanwei;  Mak, Pui-In;  da Silva Martins, Rui Paulo;  Liu, Yan;  Vong, Chi Man;  Wong, Hang Cheong;  Wong, Pak Kin;  Wang, Haitao;  Sun, Heng;  Deng, Chu-Xia
Favorite  |  View/Download:13/0  |  Submit date:2018/10/30
A 12b 180MS/s 0.068mm(2) With Full-Calibration-Integrated Pipelined-SAR ADC Journal article
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2017,Volume: 64,Issue: 7,Page: 1684-1695
Authors:  Zhong, Jianyu;  Zhu, Yan;  Chan, Chi-Hang;  Sin, Sai-Weng;  U, Seng-Pan;  Martins, Rui Paulo
Favorite  |  View/Download:9/0  |  Submit date:2018/10/30
Analog-to-digital converter (ADC)  successive approximation architecture  low power  switched-capacitor circuits  
Seven-bit 700-MS/s Four-Way Time-Interleaved SAR ADC With Partial V-cm-Based Switching Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017,Volume: 25,Issue: 3,Page: 1168-1172
Authors:  Xing, Dezhi;  Zhu, Yan;  Chan, Chi-Hang;  Sin, Sai-Weng;  Ye, Fan;  Ren, Junyan;  U, Seng-Pan;  Martins, Rui Paulo
Favorite  |  View/Download:8/0  |  Submit date:2018/10/30
Common mode variation  partial V-cm-based switching  time-interleaved successive approximation register analog-to-digital converter (TI SAR ADC)  
Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters Conference paper
Authors:  Qin, WeiWei;  Sin, Sai-Weng;  Seng-Pan, U.;  Martins, Rui Paulo;  Wang, ZH;  Xie, WH
Favorite  |  View/Download:3/0  |  Submit date:2018/10/30
Analog to Digital Converter  Test System  Automated  Sweep Function  LabVIEW  
A 10-bit 500-MS/s Partial-Interleaving Pipelined SAR ADC With Offset and Reference Mismatch Calibrations Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017,Volume: 25,Issue: 1,Page: 354-363
Authors:  Zhu, Yan;  Chan, Chi-Hang;  Pan, Seng U.;  Martins, Rui Paulo
Favorite  |  View/Download:13/0  |  Submit date:2018/10/30
Offset Calibration  Partial Interleaving (Pi)  Pipelined-sar  Stage-gain Error Calibration