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Phase transitional behavior and electric field-induced large strain in alkali niobate-modified Bi0.5(Na0.80K0.20) 0.5TiO3 lead-free piezoceramics Journal article
Journal of Applied Physics, 2014,Volume: 115,Issue: 3
Authors:  Hao J.;  Shen B.;  Zhai J.;  Chen H.
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Condensation of the atomic relaxation vibrations in lead-magnesium-niobate at T = T * Journal article
Journal of Applied Physics, 2013,Volume: 114,Issue: 12
Authors:  Prosandeev S.;  Raevski I.P.;  Malitskaya M.A.;  Raevskaya S.I.;  Chen H.;  Chou C.-C.;  Dkhil B.
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Defect mediated ferromagnetism in Ni-doped ZnO nanocrystals evidenced by positron annihilation spectroscopy Journal article
Journal of Applied Physics, 2012,Volume: 112,Issue: 8
Authors:  Chen Z.-Y.;  Chen Z.Q.;  Zou B.;  Zhao X.G.;  Tang Z.;  Wang S.J.
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Control of N/N2 species ratio in NO plasma for p-type doping of ZnO Conference paper
Journal of Applied Physics
Authors:  Chen X.;  Zhang Z.;  Yao B.;  Jiang M.;  Wang S.;  Li B.;  Shan C.;  Liu L.;  Zhao D.;  Shen D.
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Terahertz absorbance spectrum fitting method for quantitative detection of concealed contraband Journal article
Journal of Applied Physics, 2007,Volume: 102,Issue: 11
Authors:  Wang Y.;  Zhao Z.;  Chen Z.;  Kang K.;  Feng B.;  Zhang Y.
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Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique Journal article
Journal of Applied Physics, 1986,Volume: 59,Issue: 10,Page: 3467-3474
Authors:  Coulman B.;  Chen H.
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Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique Journal article
Journal of Applied Physics, 1986,Volume: 59,Issue: 10,Page: 3467-3474
Authors:  Coulman B.;  Chen H.
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Gauging film thickness: A comparison of an x-ray diffraction technique with Rutherford backscattering spectrometry Journal article
Journal of Applied Physics, 1985,Volume: 57,Issue: 2,Page: 643-645
Authors:  Coulman B.;  Chen H.;  Rehn L.E.
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Gauging film thickness: A comparison of an x-ray diffraction technique with Rutherford backscattering spectrometry Journal article
Journal of Applied Physics, 1985,Volume: 57,Issue: 2,Page: 643-645
Authors:  Coulman B.;  Chen H.;  Rehn L.E.
Favorite  |  View/Download:0/0  |  Submit date:2019/04/08