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A short-open calibration (SOC) technique to calculate the propagation characteristics of substrate integrated waveguide Conference paper
2015 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications, IEEE MTT-S IMWS-AMP 2015 - Proceedings, Suzhou, China, 7 1, 2015 - 7 3, 2015
Authors:  Liu, Zheng;  Zhu, Lei;  Wu, Qiong Sen;  Xiao, Gao Biao
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