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Effects of thickness on the electrical properties of metalorganic chemical vapor deposited Pb(Zr, Ti)O3 (25-100 nm) thin films on LaNiO3 buffered Si Journal article
Journal of Applied Physics, 2001,Volume: 90,Issue: 3,Page: 1509-1515
Authors:  Lin C.H.;  Friddle P.A.;  Ma C.H.;  Daga A.;  Chen H.
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