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Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
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Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
Favorite  |  View/Download:1/0  |  Submit date:2019/04/08