UM

Browse/Search Results:  1-4 of 4 Help

Filters            
Selected(0)Clear Items/Page:    Sort:
Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
Favorite  |  View/Download:1/0  |  Submit date:2019/04/08
Measurement of thermal stress in Pd 2 Si film on Si(111) by absorption edge contour mapping Journal article
Materials Letters, 1986,Volume: 4,Issue: 2,Page: 61-64
Authors:  Chen H.;  White G.E.;  Stock S.R.
Favorite  |  View/Download:1/0  |  Submit date:2019/04/08
X-ray topography of hydride domains Journal article
Materials Letters, 1983,Volume: 2,Issue: 2,Page: 173-175
Authors:  Stock S.R.;  Chasnov R.;  Chen Haydn.;  Birnbaum H.K.
Favorite  |  View/Download:2/0  |  Submit date:2019/04/08
X-ray topography of hydride domains Journal article
Materials Letters, 1983,Volume: 2,Issue: 2,Page: 173-175
Authors:  Stock S.R.;  Chasnov R.;  Chen Haydn.;  Birnbaum H.K.
Favorite  |  View/Download:1/0  |  Submit date:2019/04/08