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Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning Journal article
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2017,Volume: 13,Issue: 3,Page: 1213-1226
Authors:  Liu, Zhenbao;  Jia, Zhen;  Vong, Chi-Man;  Bu, Shuhui;  Han, Junwei;  Tang, Xiaojun
Favorite  |  View/Download:14/0  |  Submit date:2018/10/30
Analog Circuits  Deep Belief Network  Deep Learning  Diagnosis  Failure  Fault  Restricted Boltzmann Machines