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Residual stress measurement on TiN thin films by combing nanoindentation and average X-ray strain (AXS) method Journal article
Surface and Coatings Technology, 2015,Volume: 280,Page: 43-49
Authors:  Wang A.-N.;  Huang J.-H.;  Hsiao H.-W.;  Yu G.-P.;  Chen H.
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Average X-ray strain (AXS)  Cos2αsin2ψ method  Nanoindentation  Residual stress  TiN thin film  
Effect of thermal annealing on the structural, electrical and optical properties of Al-Ni co-doped ZnO thin films prepared using a sol-gel method Journal article
Surface and Coatings Technology, 2015,Volume: 261,Page: 149-155
Authors:  Zhang X.L.;  Hui K.S.;  Bin F.;  Hui K.N.;  Li L.;  Cho Y.R.;  Mane R.S.;  Zhou W.
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Al-Ni co-doped ZnO  Annealing temperature  Forming gas  Sol-gel method  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films deposited by unbalanced magnetron sputtering Journal article
Surface and Coatings Technology, 2006,Volume: 201,Issue: 6,Page: 3199-3204
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
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Residual stress  Texture  Ti interlayer  TiN  
Effects of nitrogen content on nanostructure evolution, mechanical behaviors and thermal stability in Ti-B-N thin films Journal article
Surface and Coatings Technology, 2006,Volume: 201,Issue: 3-4,Page: 1228-1235
Authors:  Lu Y.H.;  Shen Y.G.;  Li K.Y.;  Chen H.
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Mechanical behaviors  Microstructure  Nitrogen  Thermal stability  Ti-B-N thin films  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films Journal article
Surface and Coatings Technology, 2006,Volume: 200,Issue: 20-21,Page: 5937-5945
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
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Residual stress  Texture  Ti interlayer  Titanium nitride  
Nanohardness of nanocrystalline TiN thin films Journal article
Surface and Coatings Technology, 2006,Volume: 200,Issue: 12-13,Page: 3868-3875
Authors:  Ma C.-H.;  Huang J.-H.;  Chen H.
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Nanohardness  Residual stress  Texture  TiN  
X-Ray photoelectron spectroscopy characterization of reactively sputtered Ti-B-N thin films Journal article
Surface and Coatings Technology, 2004,Volume: 187,Issue: 1,Page: 98-105
Authors:  Lu Y.H.;  Zhou Z.F.;  Sit P.;  Shen Y.G.;  Li K.Y.;  Chen H.
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Boron  Hardness  Microstructure  Thin films  Ti-B-N  X-Ray photoelectron spectroscopy (XPS)