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An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces Journal article
Thin Solid Films, 1982,Volume: 93,Issue: 1-2,Page: 161-169
Authors:  Chen H.;  White G.E.;  Stock S.R.;  Ho P.S.
Favorite  |  View/Download:1/0  |  Submit date:2019/04/08
An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces Journal article
Thin Solid Films, 1982,Volume: 93,Issue: 1-2,Page: 161-169
Authors:  Chen H.;  White G.E.;  Stock S.R.;  Ho P.S.
Favorite  |  View/Download:2/0  |  Submit date:2019/04/08