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Quick and cost-efficient A/D converter static characterization using low-precision testing signal Journal article
MICROELECTRONICS JOURNAL, 2018,Volume: 74,Page: 86-93
Authors:  Qin, Wei Wei;  Sin, Sai-Weng;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite | View/Download：31/0 | TC[WOS]:0 TC[Scopus]:1 | Submit date：2018/10/30
Analog-to-digital Converter (Adc)  Static Characterization Estimation  Adc Testing  Ramp Testing  Nonlinear Input Signal  Attenuated Input Signal