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Design, analysis, and test of a novel 2-DOF nanopositioning system driven by dual mode Journal article
IEEE Transactions on Robotics, 2013,Volume: 29,Issue: 3,Page: 650
Authors:  Tang H.;  Li Y.
Favorite  |  View/Download:4/0  |  Submit date:2018/10/30
Active disturbance rejection controller (ADRC)  atomic force microscope (AFM)  dual mode  nanopositioning system  plant uncertainties