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Development and Active Disturbance Rejection Control of a Compliant Micro-/Nanopositioning Piezostage with Dual Mode Journal article
IEEE Transactions on Industrial Electronics, 2014,Volume: 61,Issue: 3,Page: 1475
Authors:  Tang H.;  Li Y.
Favorite  |  View/Download:5/0  |  Submit date:2018/10/30
Active disturbance rejection control  atomic force microscope (AFM)  lever displacement amplifiers (LDAs)  micro-/nanopositioning system  plant uncertainties  
Design and development of a compact flexure-based XY precision positioning system with centimeter range Journal article
IEEE Transactions on Industrial Electronics, 2014,Volume: 61,Issue: 2,Page: 893
Authors:  Xu Q.
Favorite  |  View/Download:6/0  |  Submit date:2018/10/30
Decoupling  Flexure Mechanisms  Long Stroke  Micro-/nanopositioning  Motion Control  Parallel Mechanisms