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Dielectric properties of metal-organic chemical vapor deposited highly textured Pb(ScTa)1-xTixO3 (x=0-0.3) relaxor ferroelectric thin films on LaNiO3 electrode buffered Si Journal article
Applied Physics Letters, 1999,Volume: 75,Issue: 16,Page: 2485-2487
Authors:  Lin C.H.;  Lee S.W.;  Chen H.;  Wu T.B.
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