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Gain Error Calibrations for Two-Step ADCs: Optimizations Either in Accuracy or Chip Area Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 11,Page: 2279-2289
Authors:  Wang, Guan Cheng;  Zhu, Yan;  Chan, Chi-Hang;  Seng-Pan, U.;  Martins, Rui P.
Favorite | View/Download：19/0 | TC[WOS]:0 TC[Scopus]:1 | Submit date：2019/01/17
Bridge digital-to-analog converter (DAC)  gain error calibration  successive approximation register (SAR)  analog-to-digital converters (ADCs)  testing signal generation (TSG)  
A 16-mW 1-GS/s With 49.6-dB SNDR TI-SAR ADC for Software-Defined Radio in 65-nm CMOS Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 3,Page: 572-583
Authors:  Qiu, Lei;  Tang, Kai;  Zheng, Yuanjin;  Siek, Liter;  Zhu, Yan;  U, Seng-Pan
Favorite | View/Download：40/0 | TC[WOS]:3 TC[Scopus]:5 | Submit date：2018/10/30
Digital Background Calibration  Subradix-2  Successive Pproximation Register (Sar) Analog-to-digital Converters (Adcs)  Time Interleaved (Ti)  Time Skew  
Passive Noise Shaping in SAR ADC With Improved Efficiency Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2018,Volume: 26,Issue: 2,Page: 416-420
Authors:  Song, Yan;  Chan, Chi-Hang;  Zhu, Yan;  Geng, Li;  Seng-Pan, U.;  Martins, Rui Paulo
Favorite | View/Download：41/0 | TC[WOS]:3 TC[Scopus]:7 | Submit date：2018/10/30
Analog-to-digital Converter (Adc)  Delta Sampling  Oversampling  Passive Noise Shaping (Pns)  Successive Approximation Register (Sar)  
A 12b 180MS/s 0.068mm(2) With Full-Calibration-Integrated Pipelined-SAR ADC Journal article
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2017,Volume: 64,Issue: 7,Page: 1684-1695
Authors:  Zhong, Jianyu;  Zhu, Yan;  Chan, Chi-Hang;  Sin, Sai-Weng;  U, Seng-Pan;  Martins, Rui Paulo
Favorite | View/Download：29/0 | TC[WOS]:9 TC[Scopus]:12 | Submit date：2018/10/30
Analog-to-digital converter (ADC)  successive approximation architecture  low power  switched-capacitor circuits  
A 12b 180MS/s 0.068mm2 with Full-Calibration-Integrated Pipelined-SAR ADC Journal article
IEEE Transactions on Circuits and Systems I: Regular Papers, 2017,Volume: 64,Issue: 7,Page: 1684-1695
Authors:  Jianyu Zhong;  Yan Zhu;  Chi-Hang Chan;  Sai-Weng Sin;  Seng-Pan U;  Rui Paulo Martins
Favorite | View/Download：27/0 | TC[WOS]:9 TC[Scopus]:12 | Submit date：2019/02/11
Analog-to-digital Converter (Adc)  Low Power  Successive Approximation Architecture  Switched-capacitor Circuits  
Seven-bit 700-MS/s Four-Way Time-Interleaved SAR ADC With Partial V-cm-Based Switching Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017,Volume: 25,Issue: 3,Page: 1168-1172
Authors:  Xing, Dezhi;  Zhu, Yan;  Chan, Chi-Hang;  Sin, Sai-Weng;  Ye, Fan;  Ren, Junyan;  U, Seng-Pan;  Martins, Rui Paulo
Favorite | View/Download：22/0 | TC[WOS]:5 TC[Scopus]:8 | Submit date：2018/10/30
Common mode variation  partial V-cm-based switching  time-interleaved successive approximation register analog-to-digital converter (TI SAR ADC)  
Seven-bit 700-MS/s Four-Way Time-Interleaved SAR ADC with Partial Vcm-Based Switching Journal article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017,Volume: 25,Issue: 3,Page: 1168-1172
Authors:  Dezhi Xing;  Yan Zhu;  Chi-Hang Chan;  Sai-Weng Sin;  Fan Ye;  Junyan Ren;  Seng-Pan U;  Rui Paulo Martins
Favorite | View/Download：33/0 | TC[WOS]:5 TC[Scopus]:8 | Submit date：2019/02/11
Common Mode Variation  Partial Vcm-based Switching  Time-interleaved Successive ApproximaTion Register Analog-to-digital Converter (Ti Sar Adc)  
Metastablility in SAR ADCs Journal article
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2017,Volume: 64,Issue: 2,Page: 111-115
Authors:  Chi-Hang Chan;  Yan Zhu;  Sai-Weng Sin;  Boris Murmann;  Seng-Pan U;  R. P. Martins
Favorite | View/Download：29/0 | TC[WOS]:3 TC[Scopus]:6 | Submit date：2018/10/30
Analog-to-digital Converter (Adc)  Comparator  Metastability  Successive Approximation Register (Sar)  
A 10-bit 500-MS/s Partial-Interleaving Pipelined SAR ADC With Offset and Reference Mismatch Calibrations Journal article
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2017,Volume: 25,Issue: 1,Page: 354-363
Authors:  Zhu, Yan;  Chan, Chi-Hang;  Pan, Seng U.;  Martins, Rui Paulo
Favorite | View/Download：30/0 | TC[WOS]:7 TC[Scopus]:8 | Submit date：2018/10/30
Offset Calibration  Partial Interleaving (Pi)  Pipelined-sar  Stage-gain Error Calibration  
Uniform Quantization Theory-Based Linearity Calibration for Split Capacitive DAC in an SAR ADC Journal article
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2016,Volume: 24,Issue: 7,Page: 2603-2607
Authors:  Jianwei Liu;  Yan Zhu;  Chi-Hang Chan;  Sai-Weng Sin;  Seng-Pan U;  Rui Paulo da Silva Martins
Favorite | View/Download：30/0 | TC[WOS]:7 TC[Scopus]:9 | Submit date：2019/02/14
Background Linearity Calibration  Splitdigital- To-analog Converter (Dac)  Successive Approximation Register (Sar) Adc  Uniform Quantization Theory (Uqt)