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Suppression of Hysteresis Effects in Organohalide Perovskite Solar Cells Journal article
Advanced Materials Interfaces, 2017,Volume: 4,Issue: 11
Authors:  Hou Y.;  Scheiner S.;  Tang X.;  Gasparini N.;  Richter M.;  Li N.;  Schweizer P.;  Chen S.;  Chen H.;  Quiroz C.O.R.;  Du X.;  Matt G.J.;  Osvet A.;  Spiecker E.;  Fink R.H.;  Hirsch A.;  Halik M.;  Brabec C.J.
Favorite | View/Download:13/0 | TC[WOS]:29 TC[Scopus]:38 | Submit date:2019/04/08
hysteresis behavior  interfaces engineering  ion migration  perovskite solar cells  self-assembled monolayers  
Analysis of Indium Tin Oxide Film Using Argon Fluroide (ArF) Laser-Excited Atomic Fluorescence of Ablated Plumes Journal article
APPLIED SPECTROSCOPY, 2017,Volume: 71,Issue: 4,Page: 735-743
Authors:  Ho, Sut Kam;  Garcia, Dario Machado
Favorite | View/Download:16/0 | TC[WOS]:1 TC[Scopus]:1 | Submit date:2018/10/30
Indium tin oxide  ITO  ITO film  laser-excited atomic fluorescence  LEAF  destructiveness  thin-film analysis  
Long Minority-Carrier Diffusion Length and Low Surface-Recombination Velocity in Inorganic Lead-Free CsSnI3 Perovskite Crystal for Solar Cells Journal article
ADVANCED FUNCTIONAL MATERIALS, 2017,Volume: 27,Issue: 7
Authors:  Wu, Bo;  Zhou, Yuanyuan;  Xing, Guichuan;  Xu, Qiang;  Garces, Hector F.;  Solanki, Ankur;  Goh, Teck Wee;  Padture, Nitin P.;  Sum, Tze Chien
Favorite | View/Download:32/0 | TC[WOS]:62 TC[Scopus]:79 | Submit date:2018/10/30
Long Minority-Carrier Diffusion Length and Low Surface-Recombination Velocity in Inorganic Lead-Free CsSnI 3 Perovskite Crystal for Solar Cells Journal article
Advanced Functional Materials, 2017,Volume: 27,Issue: 7
Authors:  Wu B.;  Zhou Y.;  Xing G.;  Xu Q.;  Garces H.F.;  Solanki A.;  Goh T.W.;  Padture N.P.;  Sum T.C.
Favorite | View/Download:11/0 | TC[WOS]:62 TC[Scopus]:79 | Submit date:2019/04/08
carrier dynamics  diffusion lengths  lead-free perovskite crystals  surface recombination velocity  
Modulating Cationic Ratios for High-Performance Transparent Solution-Processed Electronics Journal article
ACS Applied Materials and Interfaces, 2016,Volume: 8,Issue: 2,Page: 1139-1146
Authors:  John R.A.;  Nguyen A.C.;  Chen Y.;  Shukla S.;  Chen S.;  Mathews N.
Favorite | View/Download:8/0 | TC[WOS]:17 TC[Scopus]:19 | Submit date:2019/04/08
activation energy  indium zinc tin oxide  mobility  on-off ratio  printed electronics  thin film transistors  
Residual stress measurement on TiN thin films by combing nanoindentation and average X-ray strain (AXS) method Journal article
Surface and Coatings Technology, 2015,Volume: 280,Page: 43-49
Authors:  Wang A.-N.;  Huang J.-H.;  Hsiao H.-W.;  Yu G.-P.;  Chen H.
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Average X-ray strain (AXS)  Cos2αsin2ψ method  Nanoindentation  Residual stress  TiN thin film  
Electrocatalytic oxidation of hydrazine compound on electroplated Pd/WO3 film Journal article
Thin Solid Films, 2008,Volume: 516,Issue: 10,Page: 2957-2961
Authors:  Ye W.;  Yang B.;  Cao G.;  Duan L.;  Wang C.
Favorite | View/Download:10/0 | TC[WOS]:21 TC[Scopus]:21 | Submit date:2018/11/07
Anodic oxidation  Electroplating  Hydrazine  Pd/WO3 films  
Preparation and characterization of nanodiamond cores coated with a thin Ni-Zn-P alloy film Journal article
Materials Characterization, 2008,Volume: 59,Issue: 2,Page: 108-111
Authors:  Wang R.;  Ye W.;  Ma C.;  Wang C.
Favorite | View/Download:12/0 | TC[WOS]:20 TC[Scopus]:25 | Submit date:2018/11/07
Electroless deposition  Nanodiamond powders  Ni-Zn-P alloy thin film  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films deposited by unbalanced magnetron sputtering Journal article
Surface and Coatings Technology, 2006,Volume: 201,Issue: 6,Page: 3199-3204
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
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Residual stress  Texture  Ti interlayer  TiN  
Effects of nitrogen content on nanostructure evolution, mechanical behaviors and thermal stability in Ti-B-N thin films Journal article
Surface and Coatings Technology, 2006,Volume: 201,Issue: 3-4,Page: 1228-1235
Authors:  Lu Y.H.;  Shen Y.G.;  Li K.Y.;  Chen H.
Favorite | View/Download:7/0 | TC[WOS]:12 TC[Scopus]:15 | Submit date:2019/04/08
Mechanical behaviors  Microstructure  Nitrogen  Thermal stability  Ti-B-N thin films