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Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods Journal article
MATERIALS CHEMISTRY AND PHYSICS, 2017,Volume: 199,Page: 185-192
Authors:  Lei, Soichan;  Huang, Jia-Hong;  Chen, Haydn
Favorite  |  View/Download:11/0  |  Submit date:2018/10/30
Ti interlayer  TiN  Residual stress  Average X-ray strain  Synchrotron X-ray  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films deposited by unbalanced magnetron sputtering Journal article
Surface and Coatings Technology, 2006,Volume: 201,Issue: 6,Page: 3199-3204
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
Favorite  |  View/Download:3/0  |  Submit date:2019/04/08
Residual stress  Texture  Ti interlayer  TiN  
Effect of Ti interlayer on the residual stress and texture development of TiN thin films Journal article
Surface and Coatings Technology, 2006,Volume: 200,Issue: 20-21,Page: 5937-5945
Authors:  Huang J.-H.;  Ma C.-H.;  Chen H.
Favorite  |  View/Download:2/0  |  Submit date:2019/04/08
Residual stress  Texture  Ti interlayer  Titanium nitride