×
验证码:
换一张
Forgotten Password?
Stay signed in
Login With UMPASS
English
|
繁體
Login With UMPASS
Log In
ALL
ORCID
Title
Creator
Date Issued
Subject Area
Keyword
Document Type
Source Publication
Date Accessioned
Indexed By
Publisher
Funding Project
MOST Discipline Catalogue
Study Hall
Image search
Paste the image URL
Home
Collections
Authors
DocType
K-Map
News
Search in the results
Collection
Authors
Document Type
Journal ar... [3]
Date Issued
2014 [2]
2013 [1]
Language
英语 [3]
Source Publication
IEEE Trans... [1]
IEEE Trans... [1]
Internatio... [1]
Funding Project
Indexed By
Funding Organization
×
Knowledge Map
UM
Start a Submission
Submissions
Unclaimed
Claimed
Attach Fulltext
Bookmarks
Browse/Search Results:
1-3 of 3
Help
Selected(
0
)
Clear
Items/Page:
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Sort:
Select
Issue Date Ascending
Issue Date Descending
Title Ascending
Title Descending
Submit date Ascending
Submit date Descending
WOS Cited Times Ascending
WOS Cited Times Descending
Author Ascending
Author Descending
Journal Impact Factor Ascending
Journal Impact Factor Descending
Design, modeling, control and experiment for a 2-DOF compliant micro-motion stage
Journal article
International Journal of Precision Engineering and Manufacturing, 2014,Volume: 15,Issue: 4,Page: 735
Authors:
Li Y.
;
Xiao S.
;
Xi L.
;
Wu Z.
Favorite
|
View/Download:13/0
|
TC[WOS]:
49
TC[Scopus]:
53
|
Submit date:2018/10/30
Compliance matrix method
Double four-bar prismatic joints
Finite element analysis
Model reference adaptive PID
Development and Active Disturbance Rejection Control of a Compliant Micro-/Nanopositioning Piezostage with Dual Mode
Journal article
IEEE Transactions on Industrial Electronics, 2014,Volume: 61,Issue: 3,Page: 1475
Authors:
Tang H.
;
Li Y.
Favorite
|
View/Download:14/0
|
TC[WOS]:
103
TC[Scopus]:
114
|
Submit date:2018/10/30
Active disturbance rejection control
atomic force microscope (AFM)
lever displacement amplifiers (LDAs)
micro-/nanopositioning system
plant uncertainties
Design, analysis, and test of a novel 2-DOF nanopositioning system driven by dual mode
Journal article
IEEE Transactions on Robotics, 2013,Volume: 29,Issue: 3,Page: 650
Authors:
Tang H.
;
Li Y.
Favorite
|
View/Download:8/0
|
TC[WOS]:
80
TC[Scopus]:
100
|
Submit date:2018/10/30
Active disturbance rejection controller (ADRC)
atomic force microscope (AFM)
dual mode
nanopositioning system
plant uncertainties