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Epitaxial Growth of Well-Aligned Single-Crystalline VO 2 Micro/Nanowires Assisted by Substrate Facet Confinement Journal article
Crystal Growth and Design, 2018,Volume: 18,Issue: 7,Page: 3896-3901
Authors:  Wang L.;  Ren H.;  Chen S.;  Chen Y.;  Li B.;  Zou C.;  Zhang G.;  Lu Y.
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Facile preparation of stable PEG-functionalized quantum dots with glycine-enhanced photoluminescence and their application for screening of aflatoxin B-1 in herbs Journal article
SENSORS AND ACTUATORS B-CHEMICAL, 2018,Volume: 261,Page: 188-195
Authors:  Zhang, Lei;  Dou, Xiaowen;  Zhang, Cheng;  Ying, Guangyao;  Liu, Congmin;  Luo, Jiaoyang;  Li, Qian;  Li, Peng;  Wang, Yitao;  Yang, Meihua
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Quantum Dots  Mpeg-hs  Fluorescence Enhancement  Aflatoxin  Medicinal Herb  Flisa  
ZnO film with ultra-low background electron concentration grown by plasma-assisted MBE using Mg film as the buffer layer Journal article
Materials Research Bulletin, 2012,Volume: 47,Issue: 9,Page: 2673-2675
Authors:  Chen M.;  Zhang Q.;  Su L.;  Su Y.;  Cao J.;  Zhu Y.;  Wu T.;  Gui X.;  Yang C.;  Xiang R.;  Tang Z.
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A. Oxides  B. Epitaxial growth  C. X-ray diffraction  D. Defects  E. Electrical properties  
Influence of Zn/O ratio on structural, electrical and optical properties of ZnO thin films fabricated by plasma-assisted molecular beam epitaxy Journal article
Journal of Alloys and Compounds, 2010,Volume: 503,Issue: 1,Page: 155-158
Authors:  Zhang B.;  Yao B.;  Wang S.;  Li Y.;  Shan C.;  Zhang J.;  Li B.;  Zhang Z.;  Shen D.
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Electrical properties  Optical properties  Stoichiometric  ZnO  
Phase transformation behavior of (Pb,La)(Zr,Sn,Ti)O3 and Pb (Nb,Zr,Sn,Ti)O3 antiferroelectric thin films deposited on LaNiO 3-buffered silicon substrates by sol-gel processing Journal article
Journal of Sol-Gel Science and Technology, 2007,Volume: 42,Issue: 3,Page: 369-373
Authors:  Zhai J.;  Shen B.;  Yao X.;  Xu Z.;  Li X.;  Chen H.
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Antiferroelectric  Electrical property  Phase transformation  Sol-gel process  Thin film  
Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique Journal article
Journal of Applied Physics, 1986,Volume: 59,Issue: 10,Page: 3467-3474
Authors:  Coulman B.;  Chen H.
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Kinetics of Pd2Si layer growth measured by an x-ray diffraction technique Journal article
Journal of Applied Physics, 1986,Volume: 59,Issue: 10,Page: 3467-3474
Authors:  Coulman B.;  Chen H.
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