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Measurement of residual stress on TiN/Ti bilayer thin films using average X-ray strain combined with laser curvature and nanoindentation methods Journal article
MATERIALS CHEMISTRY AND PHYSICS, 2017,Volume: 199,Page: 185-192
Authors:  Lei, Soichan;  Huang, Jia-Hong;  Chen, Haydn
Favorite  |  View/Download:11/0  |  Submit date:2018/10/30
Ti interlayer  TiN  Residual stress  Average X-ray strain  Synchrotron X-ray  
Toward the Total Synthesis of Eurifoloid A Journal article
ORGANIC LETTERS, 2017,Volume: 19,Issue: 10,Page: 2742-2745
Authors:  Liu, Xin;  Liu, Junyang;  Zhao, Jing;  Li, Shaoping;  Li, Chuang-Chuang
View  |  Adobe PDF(3140Kb)  |  Favorite  |  View/Download:379/36  |  Submit date:2018/10/30
Residual stress measurement on TiN thin films by combing nanoindentation and average X-ray strain (AXS) method Journal article
Surface and Coatings Technology, 2015,Volume: 280,Page: 43-49
Authors:  Wang A.-N.;  Huang J.-H.;  Hsiao H.-W.;  Yu G.-P.;  Chen H.
Favorite  |  View/Download:3/0  |  Submit date:2019/04/08
Average X-ray strain (AXS)  Cos2αsin2ψ method  Nanoindentation  Residual stress  TiN thin film