UM  > 科技學院  > 電機及電腦工程系
Single-trial detection of error-related potential by one-unit SOBI-R in SSVEP-based BCI
da Cruz J.N.; Wang Z.; Wong C.M.; Wan F.
2014
Conference Name11th International Symposium on Neural Networks (ISNN)
Source PublicationLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume8866
Pages524-532
Conference DateNOV 28-DEC 01, 2014
Conference PlacePEOPLES R CHINA
Abstract

Error-related potential (ErrP) is a form of event-related potential (ERP) that is triggered in the brain when a user either makes a mistake or the application behaves differently from his/her intend. Unfortunately, due to its short-time duration, low signal-to-noise ratio, nonstationarity and transient characteristic, a single-trial extraction of ErrP remains a difficult task. In this study, we propose the use of one-unit second order blind identification with reference (SOBI-R) for extraction of ErrP in the context of steady-state visual evoked potentials based braincomputer interface (SSVEP-based BCI). Fractal features are extracted from the one-unit SOBI-R data by means of Katz fractal dimensional. At last, the ErrP classification is obtained using a regularized version of the linear discriminant analysis (LDA). The proposed method was tested on 6 subjects data and achieved an average recognition rate of correct and erroneous single-trials of 87.03% and 80.7%, respectively. These results show that single-trial detection of ErrP is feasible for SSVEP-based BCI.

KeywordBrain-computer Interface (Bci) Error-related Potentials (Errp) One-unit Second-order Blind Identification With Reference (Sobi-r) Steady-state Visual Evoked Potentials (Ssvep)
DOI10.1007/978-3-319-12436-0_58
URLView the original
Indexed BySCI
WOS Research AreaComputer Science ; Imaging Science & Photographic Technology
WOS SubjectComputer Science, Artificial Intelligence ; Computer Science, Theory & Methods ; Imaging Science & Photographic Technology
WOS IDWOS:000354869400058
Fulltext Access
Citation statistics
Cited Times [WOS]:2   [WOS Record]     [Related Records in WOS]
Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
AffiliationUniversidade de Macau
Recommended Citation
GB/T 7714
da Cruz J.N.,Wang Z.,Wong C.M.,et al. Single-trial detection of error-related potential by one-unit SOBI-R in SSVEP-based BCI[C],2014:524-532.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[da Cruz J.N.]'s Articles
[Wang Z.]'s Articles
[Wong C.M.]'s Articles
Baidu academic
Similar articles in Baidu academic
[da Cruz J.N.]'s Articles
[Wang Z.]'s Articles
[Wong C.M.]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[da Cruz J.N.]'s Articles
[Wang Z.]'s Articles
[Wong C.M.]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.