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Fundamental study of 3 dimensional pulse width modulation
Man-Chung Wong1,2; Jing Tang2; Ning-Yi Dai2; Ying-Duo Han1,2
2002
Conference NameInternational Conference on Power System Technology
Source PublicationPowerCon 2002 - 2002 International Conference on Power System Technology, Proceedings
Volume1
Pages560-564
Conference DateOCT 13-17, 2002
Conference PlaceKunming, China
CountryChina
Author of SourceIEEE PES; IEEE PES
Publication Place345 E 47TH ST, NEW YORK, NY 10017 USA
PublisherIEEE
Abstract

In this paper, a fundamental study of 3-dimensional pulse width modulation (3DPWM) is achieved. It depends on the DC linked capacitor center-split structure inverter. The mathematical model of 3DPWM for a 2-level system in rectangular, cylindrical and spherical coordinates is studied. The equivalent circuits in α,β and 0 frames are expressed independently. The conventional 2DPWM and this novel 3DPWM are compared. Generalized 3DPWM in multi-level systems is investigated. The 3D space vector modulation is also considered with simulation results. This paper forms the basic background for the further study of 3DPWM. The advantages and the disadvantages of this novel 3DPWM are also included.

KeywordActive Filter Multi-level System Power Quality Compensator Pulse Width Modulation Three-phase Converter Three-phase Four-wire System
DOIhttps://doi.org/10.1109/ICPST.2002.1053605
URLView the original
Indexed BySCI
Language英语
WOS Research AreaComputer Science ; Energy & Fuels ; Engineering
WOS SubjectComputer Science, Artificial Intelligence ; Energy & Fuels ; Engineering, Electrical & Electronic
WOS IDWOS:000180880900112
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Citation statistics
Document TypeConference paper
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Affiliation1.Tsinghua University, Beijing, China
2.Department of EEE, University of Macau.
First Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Man-Chung Wong,Jing Tang,Ning-Yi Dai,et al. Fundamental study of 3 dimensional pulse width modulation[C]//IEEE PES; IEEE PES. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2002:560-564.
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