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Quick and cost-efficient A/D converter static characterization using low-precision testing signal
Qin, Wei Wei1; Sin, Sai-Weng1; Seng-Pan, U.1,2; Martins, Rui Paulo1
2018-04
Source PublicationMICROELECTRONICS JOURNAL
ISSN0026-2692
Volume74Pages:86-93
Abstract

The measurement of the analog-to-digital converter (ADC) output by exciting the signal generator with a high precision input signal allows the determination of ADC's static characteristics using a histogram-based approach. However, this method exhibits some limitations imposed by the input signal, including its high resolution and high linearity that are causes for concern when testing a high precision ADC. Recent research work has been trying to overcome such limitations. Nonetheless, it is necessary to discover a simple and low-cost method to measure the linearity of a high precision ADC through a low precision stimulus. This paper introduces a novel procedure that allows the relaxation of the requirements of the signal source for estimating ADC's linearity characteristics. The proposed method requires two sets of testing sources, being both ramp signals, one of low-precision and the other attenuated. Simulation and experimental results validate the proposed method in different ADCs.

KeywordAnalog-to-digital Converter (Adc) Static Characterization Estimation Adc Testing Ramp Testing Nonlinear Input Signal Attenuated Input Signal
DOIhttp://doi.org/10.1016/j.mejo.2018.02.001
URLView the original
Indexed BySCI
Language英语
WOS Research AreaEngineering ; Science & Technology - Other Topics
WOS SubjectEngineering, Electrical & Electronic ; Nanoscience & Nanotechnology
WOS IDWOS:000427900800010
PublisherELSEVIER SCI LTD
The Source to ArticleWOS
Fulltext Access
Citation statistics
Document TypeJournal article
CollectionDEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING
Corresponding AuthorSin, Sai-Weng
Affiliation1.State-Key Laboratory of Analog and Mixed-Signal VLSI, Dept. of ECE/FST, University of Macau, Macao, China
2.Synopsys Macau Ltd, China
First Author AffilicationUniversity of Macau
Corresponding Author AffilicationUniversity of Macau
Recommended Citation
GB/T 7714
Qin, Wei Wei,Sin, Sai-Weng,Seng-Pan, U.,et al. Quick and cost-efficient A/D converter static characterization using low-precision testing signal[J]. MICROELECTRONICS JOURNAL,2018,74:86-93.
APA Qin, Wei Wei,Sin, Sai-Weng,Seng-Pan, U.,&Martins, Rui Paulo.(2018).Quick and cost-efficient A/D converter static characterization using low-precision testing signal.MICROELECTRONICS JOURNAL,74,86-93.
MLA Qin, Wei Wei,et al."Quick and cost-efficient A/D converter static characterization using low-precision testing signal".MICROELECTRONICS JOURNAL 74(2018):86-93.
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