UM
Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters
Qin, WeiWei; Sin, Sai-Weng; Seng-Pan, U.; Martins, Rui Paulo; Wang, ZH; Xie, WH
2017
Conference Name2017 6TH INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND COMPUTER SCIENCE (ICAMCS 2017)
Pages218-225
Publication Place703 KILMAR CRES, OTTAWA, ONTARIO K2T 0B1, CANADA
PublisherCLAUSIUS SCIENTIFIC PR INC
AbstractThis paper describes an automated test system for Analog to Digital Converters (ADC) combining various instruments controlled by LabVIEW, to implement standard based real-time measurement which accurately characterizes the statistical and dynamic performances. Moreover, the proposed system provides an automated input parameter sweep-function, which realizes the ADC intelligent automation test with different input settings. Virtual Instruments (VIs) were created in system program to control signal generation and data acquisition. The system is not limited to the type or speed of the ADC under test due to its high compatibility and hardware modularity. We describe in detail the hardware arrangement and software programming, as well as the experimental testing of real ADCs, to demonstrate system's performance.
KeywordAnalog to Digital Converter Test System Automated Sweep Function LabVIEW
DOI10.23977/icames.2017.1028
URLView the original
Indexed ByCPCI
Language英语
WOS Research AreaEngineering ; Materials Science ; Mathematics
WOS SubjectEngineering, Mechanical ; Materials Science, Multidisciplinary ; Mathematics, Applied
WOS IDWOS:000432428300028
The Source to ArticleWOS
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Document TypeConference paper
CollectionUniversity of Macau
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GB/T 7714
Qin, WeiWei,Sin, Sai-Weng,Seng-Pan, U.,et al. Automated Test System with Input Parameters Sweep-Function for Analog-to-Digital Converters[C]. 703 KILMAR CRES, OTTAWA, ONTARIO K2T 0B1, CANADA:CLAUSIUS SCIENTIFIC PR INC,2017:218-225.
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