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Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal
Bin Liu1,2; Yimin Shi1; Jing Cai1; Ruibing Wang1
2017
Source PublicationCOMMUNICATIONS IN STATISTICS-THEORY AND METHODS
ISSN0361-0926
Volume46Issue:12Pages:6174-6191
Abstract

By combining the progressive hybrid censoring with the step-stress partially accelerated lifetime test, we propose an adaptive step-stress partially accelerated lifetime test, which allows random changing of the number of step-stress levels according to the pre-fixed censoring number and time points. Thus, the time expenditure and economic cost of the test will be reduced greatly. Based on the Lindley-distributed tampered failure rate (TFR) model with masked system lifetime data, the BFGS method is introduced in the expectation maximization (EM) algorithm to obtain the maximum likelihood estimation (MLE), which overcomes the difficulties of the vague maximization procedure in the M-step. Asymptotic confidence intervals of components' distribution parameters are also investigated according to the missing information principle. As comparison, the Bayesian estimation and the highest probability density (HPD) credible intervals are obtained by using adaptive rejection sampling. Furthermore, the reliability of the system and components are estimated at a specified time under usual and severe operating conditions. Finally, a numerical simulation example is presented to illustrate the performance of our proposed method.

KeywordAdaptive Step-stress Partially Accelerated Lifetime Test Adaptive Rejection Sampling Em-qn Algorithm Lindley Distribution Tampered Failure Rate Model
DOI10.1080/03610926.2015.1122058
Indexed BySCI
Language英语
WOS Research AreaMathematics
WOS SubjectStatistics & Probability
WOS IDWOS:000395580600033
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Cited Times [WOS]:1   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionPersonal research not belonging to the institution
Corresponding AuthorBin Liu
Affiliation1.Department of Applied Mathematics, Northwestern Polytechnical University, Xi’an, China
2.School of Applied Science, Taiyuan University of Science and Technology, Taiyuan, China
Recommended Citation
GB/T 7714
Bin Liu,Yimin Shi,Jing Cai,et al. Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal[J]. COMMUNICATIONS IN STATISTICS-THEORY AND METHODS,2017,46(12):6174-6191.
APA Bin Liu,Yimin Shi,Jing Cai,&Ruibing Wang.(2017).Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal.COMMUNICATIONS IN STATISTICS-THEORY AND METHODS,46(12),6174-6191.
MLA Bin Liu,et al."Reliability analysis of masked data in adaptive step-stress partially accelerated lifetime tests with progressive removal".COMMUNICATIONS IN STATISTICS-THEORY AND METHODS 46.12(2017):6174-6191.
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