UM
Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC
Wang, Guancheng; Li, Cheng; Zhu, Yan; Zhong, Jianyu; Lu, Yan; Chan, Chi-Hang; Martins, Rui P.
2018-11
Conference NameIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
Volume65
Issue11
Pages3707-3719
Publication Place445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA
PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
AbstractThis paper reports a calibration scheme that can be used to correct the inter-stage gain error in two-stage analog-to-digital converters (ADCs). We measure the static nonlinearity at the raw ADC outputs and compensate it through a feedback path to adjust the gain in the analog domain, which avoids the dynamic range loss in the conventional pure digital calibrations. The proposed scheme detects the error via the missing-code-occurrence probability (MCOP), which is insensitive to the comparator offset and has better immunity to its noise. Besides the gain error, we discuss other DAC linearity issues, such as the implementations of the reference buffer and the low-dropout (LDO) regulator. To verify the MCOP calibration, we design a 12-bit successive-approximation-register ADC, employing the bridge-DAC, in 65-nm CMOS. We integrate the ADC operating at 100 MS/s with the MCOP calibration, the reference buffers, and the LDO. The measurement results demonstrate the linearity enhancement after the proposed calibration, where we improve the signal-to-noise-and-distortion ratio to 61.38 dB, leading to a FoM of 16.7 fJ/conversion step at the Nyquist input frequency.
KeywordGain error calibration testing signal generation SAR ADC bridge DAC low-dropout (LDO) regulator
DOI10.1109/TCSI.2018.2858848
URLView the original
Indexed BySCI ; CPCI
Language英语
WOS Research AreaEngineering
WOS SubjectEngineering, Electrical & Electronic
WOS IDWOS:000446922100011
The Source to ArticleWOS
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Document TypeConference paper
CollectionUniversity of Macau
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Wang, Guancheng,Li, Cheng,Zhu, Yan,et al. Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC[C]. 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC,2018:3707-3719.
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