UM
The measurement of strain fields by X-ray topographic contour mapping
Stock S.R.2; Chen H.2; Birnbaum H.K.2; Stock S.R.1
1986
Source PublicationPhilosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
ISSN01418610
Volume53Issue:1Pages:73-86
AbstractAn X-ray topographic method is described for measuring the magnitude of the components of the strain tensor as a function of position in single crystal specimens. Several variants of the technique are described for use with monochromatic or white X-radiation. Results are reported for some components of the deformation field surrounding a precipitate of β-NbH. Possible applications of contour mapping are discussed. © 1986 Taylor & Francis Group, LLC.
DOI10.1080/01418618608242808
URLView the original
Language英語
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Cited Times [WOS]:8   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionUniversity of Macau
Affiliation1.Georgia Institute of Technology
2.University of Illinois at Urbana-Champaign
Recommended Citation
GB/T 7714
Stock S.R.,Chen H.,Birnbaum H.K.,et al. The measurement of strain fields by X-ray topographic contour mapping[J]. Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties,1986,53(1):73-86.
APA Stock S.R.,Chen H.,Birnbaum H.K.,&Stock S.R..(1986).The measurement of strain fields by X-ray topographic contour mapping.Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties,53(1),73-86.
MLA Stock S.R.,et al."The measurement of strain fields by X-ray topographic contour mapping".Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties 53.1(1986):73-86.
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