UM
Impact of heat treatment on the electrical properties of LaNiO3 conductive thin films
Lu S.G.; Chen H.
2005
Source PublicationKey Engineering Materials
Volume280-283
IssueI
Pages873-876
AbstractLaNiO (LNO) has been used as bottom electrode layer for ferroelectric and antiferroelectric thin films due to its good conduction, preferred (100) orientation, same crystalline structure as many perovskite ferroelectrics and antiferroelectrics, good adhesion and compatibility with the Pt/Ti/SiO/Si template. In this study we have investigated the ideal optimal post - annealing conditions for LaNiOs thin films deposited at 450°C using a magnetron sputtering method. Heat treatment from 500 to 1200°C was performed. Scanning electron microscopy (SEM), x-ray diffraction (XRD) and electrical measurements were carried out to characterize the morphology, structure, and macroscopic properties. Results indicated that the LNO film had the best quality when annealed at about 800°C. Above this temperature, the morphology, structure and associated properties would deteriorate.
KeywordConductive Dielectric properties Heat annealing LaNiO3
URLView the original
Language英語
Fulltext Access
Document TypeConference paper
CollectionUniversity of Macau
AffiliationCity University of Hong Kong
Recommended Citation
GB/T 7714
Lu S.G.,Chen H.. Impact of heat treatment on the electrical properties of LaNiO3 conductive thin films[C],2005:873-876.
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Lu S.G.]'s Articles
[Chen H.]'s Articles
Baidu academic
Similar articles in Baidu academic
[Lu S.G.]'s Articles
[Chen H.]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Lu S.G.]'s Articles
[Chen H.]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.