UM
Effect of orientation on the ferroelectric behavior of (Pb,Sr)TiO 3 thin films
Zhai J.1; Yao X.1; Xu Z.2; Chen H.2
2006
Source PublicationJournal of the American Ceramic Society
Volume89
Issue1
Pages354-357
AbstractPbSrTiO (PST) ferroelectric thin films were prepared on two different substrates by sol-gel methods. Films derived on the LaNiO(LNO)/Pt/Ti/SiO/Si substrates showed a strong (100) preferred orientation. The PST thin films grown on the LNO/Pt/Ti/SiO /Si(100) substrate showed a non-uniform rounded grain size distribution and have a larger polarization and lower coercive field E . The dependence of electrical properties derived on the Pt/Ti/SiO/Si and LNO/Pt/Ti/SiO/Si substrates has been studied, with a focus on the change of dielectric constant versus direct current (DC) bias field. The dielectric and ferroelectric properties of the Pb SrTiO thin films deposition on two kinds of substrates were investigated as a function of temperature, frequency and DC bias field. © 2005 by The American Ceramic Society.
DOI10.1111/j.1551-2916.2005.00680.x
URLView the original
Language英語
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Cited Times [WOS]:13   [WOS Record]     [Related Records in WOS]
Document TypeConference paper
CollectionUniversity of Macau
Affiliation1.Tongji University
2.City University of Hong Kong
Recommended Citation
GB/T 7714
Zhai J.,Yao X.,Xu Z.,et al. Effect of orientation on the ferroelectric behavior of (Pb,Sr)TiO 3 thin films[C],2006:354-357.
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