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Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates
Zhai J.1; Yao X.1; Xu Z.2; Chen H.2
2006-08-23
Source PublicationJournal of Applied Physics
ISSN00218979
Volume100Issue:3
AbstractThin films of ferroelectric PbSrTiO (PST) with x=0.3-0.7 and graded composition were fabricated on LaNiO buffered Pt/Ti/SiO/Si substrates by a sol-gel deposition method. The thin films crystallized into a single perovskite structure and exhibited highly (100) preferred orientation after postdeposition annealing at 650°C. The grain size of PST thin films systematically decreased with the increase of Sr content. Dielectric and ferroelectric properties were investigated as a function of temperature, frequency, and dc applied field. Pb SrTiO films showed a dominant voltage dependence of dielectric constant with a high tunability in a temperature range of 25-230°C. The compositionally graded PST thin films with x=0.3-0.6 also showed the high tunability. The graded thin films exhibited a diffused phase transition accompanied by a diffused peak in the temperature variations of dielectric constants. This kind of thin films has a potential in a fabrication of a temperature stable tunable device. © 2006 American Institute of Physics.
DOI10.1063/1.2234554
URLView the original
Language英語
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Cited Times [WOS]:36   [WOS Record]     [Related Records in WOS]
Document TypeJournal article
CollectionUniversity of Macau
Affiliation1.Tongji University
2.City University of Hong Kong
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Zhai J.,Yao X.,Xu Z.,et al. Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates[J]. Journal of Applied Physics,2006,100(3).
APA Zhai J.,Yao X.,Xu Z.,&Chen H..(2006).Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates.Journal of Applied Physics,100(3).
MLA Zhai J.,et al."Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates".Journal of Applied Physics 100.3(2006).
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