UM  > 應用物理及材料工程研究院
Auger-type hole trapping process at green emission centers of ZnO Nanowires
Sum T.C.2; Li M.2; Xing G.2; Wu T.2; Xing G.1
Conference NameConference on Lasers and Electro-Optics (CLEO)
Source Publication2013 Conference on Lasers and Electro-Optics, CLEO 2013
Conference DateJUN 09-14, 2013
Conference PlaceSan Jose, CA

The origins of the green emission (GE) from ZnO nanostructures remain highly controversial despite extensive studies. Herein, transient absorption spectroscopy (TAS) revealed a small Stokes shift of ∼180 meV between the GE-centers (located at ∼0.7 eV above the valence band) and the GE peak - yielding the first experimental evidence of the GE originating from charge transitions of the ZnO di-vacancies proposed recently in density functional calculations. TAS also uncovered an ultrafast Auger-type hole-trapping process to V that occurs in a sub-ps timescale. © 2013 The Optical Society.

URLView the original
Indexed BySCI
WOS Research AreaEngineering ; Optics ; Physics
WOS SubjectEngineering, Electrical & Electronic ; Optics ; Physics, Applied
WOS IDWOS:000355262505040
Fulltext Access
Citation statistics
Document TypeConference paper
Affiliation1.Univ New S Wales, Sch Mat Sci & Engn, Sydney, NSW 2052, Australia
2.Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 637371, Singapore
Recommended Citation
GB/T 7714
Sum T.C.,Li M.,Xing G.,et al. Auger-type hole trapping process at green emission centers of ZnO Nanowires[C],2013.
Related Services
Recommend this item
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Sum T.C.]'s Articles
[Li M.]'s Articles
[Xing G.]'s Articles
Baidu academic
Similar articles in Baidu academic
[Sum T.C.]'s Articles
[Li M.]'s Articles
[Xing G.]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Sum T.C.]'s Articles
[Li M.]'s Articles
[Xing G.]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.